1

Use of wafer maps in integrated circuit manufacturing

Year:
1998
Language:
english
File:
PDF, 762 KB
english, 1998
6

Aspects of statistical consulting not taught by academia

Year:
2006
Language:
english
File:
PDF, 158 KB
english, 2006
12

A statistical test for the mean squared error

Year:
1999
Language:
english
File:
PDF, 1.53 MB
english, 1999
18

Approximately Optimal Narrow Limit Gauges

Year:
1985
Language:
english
File:
PDF, 716 KB
english, 1985
19

Approximately Optimal Narrow Limit Gauges

Year:
1985
File:
PDF, 716 KB
1985
22

Calibration with absolute shrinkage

Year:
2001
Language:
english
File:
PDF, 126 KB
english, 2001
24

Modelling the time correlation in hourly observations of direct radiation in clear skies

Year:
1988
Language:
english
File:
PDF, 846 KB
english, 1988
26

On Conformity Testing and the Use of two Stage Procedures

Year:
2001
Language:
english
File:
PDF, 1017 KB
english, 2001
27

Discussion

Year:
1999
Language:
english
File:
PDF, 225 KB
english, 1999
33

Calibration with Empirically Weighted Mean Subset

Year:
2002
Language:
english
File:
PDF, 322 KB
english, 2002
35

Response to the Letter to the Editor by Robert Dworkin

Year:
2007
Language:
english
File:
PDF, 65 KB
english, 2007
39

Prediction Based on Mean Subset

Year:
2002
Language:
english
File:
PDF, 1.01 MB
english, 2002
45

Prediction Based on Mean Subset

Year:
2002
Language:
english
File:
PDF, 387 KB
english, 2002
46

A Method For Identifying Which Tolerance Causes Malfunction In Assembled Products

Year:
2003
Language:
english
File:
PDF, 133 KB
english, 2003
48

Autotransfusion of drainage blood in arthroplasty

Year:
1992
Language:
english
File:
PDF, 327 KB
english, 1992